Modular PXI, PCI, LXI Switching, Programmable Resistors, Digital I/O and more...
When it comes to test, our customers care about breadth of choice—that is why we are continually expanding our range of PXI, LXI and PCI switching solutions. We have switching products for virtually every application that can be tested, over 1,000 modules in PXI switching alone, and we are continually working to develop new products. Can't find what you need, challenge us to develop a custom switching solution to meet your test and measurement requirements.
Over 45 years of experience in switching technology, this includes in-house design and manufacturing of quality reed relays. To learn more about our reed relays, please visit pickeringrelay.com.
We stand behind all switching products manufactured by us with a standard three-year warranty.
Microwave multiplexer modules designed for switching 50 Ohm signals up to 40GHz
A range of high density matrix configurations able to switch up to 2 Amp or 200VDC/140VAC
This matrix allows signal insertion between UUT and test systems
The 50-265 is a 6 channel strain gauge simulator card suitable for testing strain gauge meters and a wide variety of industrial control systems.
The 50-262 is a PCI card that supports 6 channels of RTD simulation. The card is a cost effective method of simulating
either PT100 or PT1000 RTDs.
Programmable Resistor with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card.
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module.
2 Amp Multiplexer card is available in 9 standard configurations, and 9 half density configurations, all capable of switching 2A current and up to 300VDC/250VAC.
A comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These systems range from small low-cost entry level systems to large high performance units with built-in test.