Automotive Testing Expo 2017 - USA

Automotive Testing Expo 2017

Pickering Interfaces to Showcase New PXI and LXI Switching Solutions

Preview for Auto Testing Expo – Detroit, MI – October 24 - 26 

Pickering Interfaces, a leading provider of signal switching and simulation solutions used in electronic test and verification, will showcase their latest high-density PXI and Ethernet LXI Switching & Simulation Solutions at Auto Testing Expo 2017 in booth 11046, in Detroit, MI, including: 

4-slot USB/LXI Modular Chassis (model 60-105) – This chassis complements Pickering’s 4-slot LXI/USB Chassis with optional WiFi donglerecently released 2-slot USB/LXI Modular Chassis in that they both offer a small, lightweight form/factor ideal for portable, benchtop and space restrictive applications. These chassis are designed for desk or rack mounting and feature remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment. This new 4-slot Chassis supports between one and four P ickering 3U PXI modules. Possible systems include switching matrices up to 2208 crosspoints or up to 72 channels of programmable resistor/sensor simulation. 

Both the 2-slot and this new 4-slot chassis are USB 3.0 compatible and have a fully compliant LXI interface. These communications standards enable the chassis to be controlled directly through standard interfaces found on most personal computers and tablets that support HTML5, allowing for a very practical route into a variety of applications in the modular test and measurement market. 

BRIC Ultra-High-Density 1A PXI MatrixBRIC™ Ultra-High-Density PXI Matrix Modules (model 40-559) – This range of PXI matrices are robust 1Amp/20W switching modules, with up to 4,096 crosspoints. Constructed with the Pickering Electronics’ new 4mm x 4mm Reed Relays, these new 1Amp matrices have similar switch densities compared to 0.25Amp, 0.3Amp or 0.5Amp high-density matrix solutions on the market, providing far more robust and reliable switching in the same footprint. The matrices are available in 2, 4, or 8-slot PXI sizes and are designed for high performance matrix requirements. With their high level of switching density, these PXI matrices allow a complete Functional ATE system to be housed in a single 3U PXI or PXIe Hybrid chassis.

The 40-559 is available with Y-bus widths of x4, x6, x8, x12 & x16, the three smaller versions having the added versatility of a dual analog bus which allows each BRIC module to be programmatically configured as two totally separate matrices.

The range comes with Pickering’s Built-in Relay Self-Test (BIRST) and is also supported by their eBIRST Switching System Test Tools. These tools provide a quick and simple way of finding relay failures within the modules. 

High-Density Scalable LXI Matrix SolutionHigh-Density Scalable LXI Ethernet Reed Relay Matrix Solution (model 60-2xx) – Originally designed to test Semiconductors at wafer and package levels, this Reed Relay Matrix solution combines our LXI Matrix Chassis with our new plug-in matrices that provide access to all signal connections on 200 pin connectors. The range comprises four models covering matrices of up to 1,536x4 in increments of 128, 768x8 in increments of 64, 384x16 in increments of 32, and 192x32 in increments of 32. 

Users can specify as many or as few plug-ins (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing. 

This matrix solution also offers built-in scan list sequence stores with triggering capability, providing users with the ability to set a series of pre-determined sequences on a LXI instrument, the sequences can be triggered by software or one of the sixteen DIO software configurable open collector triggers. They also feature multi-bus capability for parallel testing.  

Hardware-in-the-Loop (HIL) Simulation Demo including various PXI modules ranging from Pickering’s fault insertion switching, programmable resistor and thermocouple simulation ranges 

PXI Fault Insertion Module (model 40-200) – This module is designed to simulate common faults on two wire communication interfaces such as CAN Bus. The module supports 4 or 8-channels of two wire serial interfaces. Each channel can simulate an open fault in either or both wires, a short between both wires or a short to one of the eight externally applied Fault connections, such as a battery connection or ground, via four fault buses. 

Also highlighted in the booth will be Pickering’s eBIRST Switching System Test Tools and Switch Path Manager Signal Routing Software. The eBIRST tools were designed specifically for Pickering’s PXI, PCI or LXI (Ethernet) products, they simplify switching system fault-finding by quickly testing the system and graphically identifying the faulty relay. Switch Path Manager signal routing software streamlines signal routing through switching systems and speeds up the development of switching system software. 

Pickering Interfaces stands behind all of their manufactured products with a standard three-year warranty and guaranteed long-term product support.