At Pickering, we understand you folks in the automotive
aerospace industries have the most challenging electronic testing requirements. Since 1988, we have designed and manufactured commercial and custom switching and simulation systems and instrumentation for a wide range of diverse functional test and hardware-in-the-loop simulation applications to help in the test and validation of automotive and aerospace electronics. Take a look below to learn about these solutions and take a look at our video:
Automated Fault Insertion and its Role in Hardware-in-the-Loop (HIL) Simulation
Our Switching & Simulation Solutions for Hardware-in-the-Loop (HIL) Simulation Applications Include:
PXI Fault Insertion Unit (FIU) Switching for Fault Insertion Testing
These FIU switch products can be used to introduce electrical faults into a system—this test process typically duplicates
various conditions which could occur because of corrosion, short/open circuits and other electrical failure
inherited through age, damage or even faulty installation.
PXI Programmable Resistors for Sensor Simulation
A Hardware-in-the-Loop system employed to test an ECU needs to simulate the behavior of these sensors as
accurately as possible to ensure the ECU behaves on the test bench exactly as it would in the real-world.
Take a look at our PXI programmable resistor modules developed to help test system designers achieve
PXI Millivolt Thermocouple Simulators for Sensor Simulation
These simulators provide 32, 24, 16 or 8 channels of accurate low sources. They are ideal for the simulation of thermocouples
and can be used for sensor emulation in ECU testing. The channels can be operated with one of three voltage
ranges covering most thermocouple types. We can also supply connection solutions allowing the easy integration
of the Thermocouple Simulator into your test system.
PXI LVDT, RVDT, Resolver Simulators for Sensor Simulation
Increase test flexibility and reduce cost with this high-performance simulators. More versatile than competing products,
replacing multiple products with just one that fits into a single PXI slot. They can handle up to four
channels of 5/6-Wire LVDT/RVDT or Resolver or eight channels of 4-Wire LVDT/RVDT simulation.
Modular Breakout Systems
This Modular Breakout System combines a BoB feature set with the added flexibility of an FIU. By mating the
FIU chassis directly to the BoB using our plug-in modules, cabling is minimized, creating a more compact
reliable design and improving signal integrity.
Whose fault is it when ECU's go wrong?
Electronic Control Units (ECUs) are ever-present in today's automotive and aerospace industries. They are increasingly being
used in safety-critical applications that demand the highest reliability in environments where undesirable behavior cannot
be tolerated - the failure of an ECU to act in an appropriate manner under emergency conditions could pose a threat to
life and/or property. Ensuring these demands are unconditionally met requires significant investment in test procedures
An ECU relies on information from a set of sensors and controls to decide what to do with the device it is managing. These
sensors are themselves often working in extremely hostile environments (e.g. car or jet engines) and predictably failures
can occur in the sensors or their interconnections. The ECU has to respond appropriately to these component failures
as well as to genuine system faults. A jet engine needs to shut down if it catches on fi re, but should not shut down
if it is clear there is a sensor fault.
Another example of an ECU operating in a hostile environment is the automotive Powertrain Control Modules (PCMs). The PCM
is one of the most complex controllers in the modern vehicle and therefore requires rigorous testing of its functionality.
The consequences of PCM failure have greater significance in X-by-Wire applications (a collective term for the addition
of electronic systems into a vehicle to enhance and replace tasks that were previously accomplished via mechanical and
hydraulic systems such as braking or steering), placing increased importance upon these test methods.
In addition to these fault insertion switch and sensor simulation products, we also
offer a comprehensive range of supporting products:
- An important test of automotive ECUs is to see if the inputs respond to switches that are dirty and do not present a normal
open/closed resistance. Our modules are designed to simulate the operation of automotive switches
where dirty contacts or leaking current can be expected from switch contamination. This allows automotive
input/output (I/O) devices to be tested for correct operation under adverse conditions.
The testing and verification of electrical and electronic systems often requires the connection of high current loads to
the Unit Under Test (UUT). We provide a wide range of
that can support up to 40 Amp load switching within a PXI chassis. For higher current requirements, our relay driver modules
allow the test system to control external relays.
- Our digital I/O modules allow you to interface directly with high current loads such as solenoid coils. These modules
have fully protected outputs that can withstand high current and voltage surges without damage and
include thermal protection, ensuring that even long term connection to a faulty load will not cause
instrumentation damage. Our digital inputs feature adjustable dual thresholds that allow you to easily
establish if a digital input is in a low high or unpredictable state. Their high input voltage capacity
makes them an excellent choice for monitoring systems working from high voltage power supplies commonly
found in aerospace applications.
- ECUs communicate with other system components for functionality, diagnostics and human interface via one or more serial
bus channels. We have partnered with industry expert Ballard Technology to offer a family of products
to the highest level of flexibility and power. These modules support high channel counts of single or multiple protocols.
In addition, our
can support up to 10 CAN channels as well as other automotive protocols and physical layer interfaces.
- Most PXI signal/arbitrary waveform generators lack the amplitude necessary to drive signals that simulate peripherals.
Typically, additional circuitry needs to be added to the test fixture to amplify the output of the
multi-channel, gain selectable amplifiers
work with many instruments including our
features selectable input ranges that accept up to 600 volt waveforms.
RF and Microwave
- we offer an extensive range of RF switching products, with PXI solutions ranging from 300MHz high density modules through
to high performance 3GHz multiplexers, solid state and microwave switches to 67GHz. We also offer
a programmable attenuator from DC to 3GHz with an attenuation depth of 63dB in 1 dB steps.
- Testing of complex systems in an environmental chamber requires sharing the external instrumentation/ resources to stimulate
and collect data from the UUTs over the cycles of the test. Our
BRIC™ high density switch matrix
module can provide over 4,400 cross-points in eight PXI slots with configurations up to 552 x 8 and 1104 x 4.
Cable & Connector Solutions
- Pickering Interfaces understands that just providing switching and instrumentation modules is not enough - users need to
be provided with fast and effective ways of connecting their investment to the device under test.
The modules in our PXI and LXI families are fully supported by our comprehensive range of connector
and cable accessories.
Have a question or need more information?
Start a conversation with us today