Articles & White Papers
Below you will find various articles, interviews and white papers offering information about signal switching and simulation for PXI, LXI, PCI & USB test applications. You can also take a look at our Knowledgebase, Blog or feel free to contact us for more information.
White Papers:
- NEW...How to Build Successful Switching Systems for Mission-Critical Test Applications
- NEW...Using PXI-based Fault Insertion & Sensor Simulation in Electronic Test
- NEW...Secrets to Efficiently Sustaining Your Automated Test System
- Accelerating Integration in Automated Test Systems
- Avoiding Failure Modes in Switch Systems for Test
- Automating Test Within Manufacturing Processes
- Using Switch Matrices in Complex Test and Verification Installations
- The Challenges Surrounding Switching for Automated Test Systems
- Understanding Programmable Resistors for Sensor Simulation in Test
- Making the Right Choices when Specifying an RF Switching System
Articles & Interviews:
- Case Study - Streamlining multi-site aerospace validation & production test systems - Pickering Article published in Electronic Product Design & Test
- Programmable resistors: the flexible approach to sensor simulation in test - Pickering Article published in Electronic Product Design & Test
- Moving Your Test & Measurement System from VXI to PXI : Not If, But When - Pickering Article
- More Automation for ECU Testing Pickering article published in Automotive Engineering Magazine
- Switching is Boring but Essential for Automated Test EETimes Test & Measurement Blog
- Interview - Technology and Expertise in Automotive Test EPP Europe April 2016
- The Reasons for Switching and Routing Software Electronics World, December 2015
- Shorts-Open Test Application Illustrates Switch-Matrix Choices Evaluation Engineering - Rick's Blog, December 2015
- Interview - Latest Trends in Modular Instrumentation Industry
Electronics for You, October 2015
- LXI after the first 10 years Evaluation Engineering, August 2015
- How PXI Can Solve Your Toughest Test & Measurement Challenges Pickering Article
- Selecting the Right Device Driver for PXI Hardware: VISA or IVI? Pickering Article
- Diagnosetests verkürzen Ausfallzeiten bei Testsystemen ELEKTONIK PRODUKTION & PRÜFTECHNIK, February 2015
- Executive Insight - Emphasizing Switching and Support Evaluation Engineering, December 2014
- What are Programmable Resistors? Pickering Article
- What is PXI? Your Questions Answered Pickering Article
- Special Report: Can PXI become the design test tool of choice? New Electronics, June 2014
- Schalten mit Selbsttest All Electronics-de, April 2014
- Matrix maintenance in PXI EPP Europe, November 2013
- Freedom is Good - article takes a look at various test platforms and where they now appear to be headed
Electronic Specifier Design Magazine, November 2013
- LXI System zur Signalüberwachung der Teilchenbeschleuniger am CERN Originally published on Global SMT & Packaging, August 2013
- Pickering's LXI Switching Matrix chosen for Collider Signal Monitoring at CERN Pickering Article, July 2013
- PXI – Platform Partners New Electronics, May 2013
- LXI oder PXI – welche Plattform eignet sich für meine Schaltapplikation? Elektronik Praxis, May 2013
- PXI matures nicely into adulthood New Electronics, May 2013
- Wir liefern Systeme in zwei bis drei Monaten EPP Online Interview 2013
- A Solution for Testing Battery Management Systems Evaluation Engineering
- Testing for the Unexpected - An Automated Method of Injecting Faults for Engine
Management Development Pickering Article
